IEEE International Conference on Metrology for eXtended Reality, Artificial Intelligence and Neural Engineering (MetroXRAINE 2025)
Ancona AnconaThe 2025 IEEE International Conference on Metrology for eXtended Reality, Artificial Intelligence and Neural Engineering - IEEE MetroXRAINE 2025 - will be an international event mainly aimed at creating a synergy between experts in eXtended Reality, Brain-Computer Interface, and Artificial Intelligence, with special attention to the Measurement. The conference will be a unique opportunity for discussion among scientists, technologists, […]